Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Fanless Embedded System With 7th/6th Gen Intel® Core™, Pentium® And Celeron® Processor, Compact Size For Video Analytics In Vehicle PC Market
UST100-504-FL
*CE, FCC certified; ISO 7637-2 compliant*LGA1151 7th/6th gen Intel® Core™ & Pentium® processors (up to 35W) with Intel® H110*Fanless and Wide operating temperatures from -40°C to +60°C*12/24 VDC power input, with power management (ACC ignition)*Single-sided I/O design for easy maintenance*Expansion capability for three PCI Express Mini Card slot and two internal SIM card slot
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X-ray inspection system for BLU, LED Long bar products
X-eye 9000LED
X-ray Tube100kV / 200uAMin. Resolution5µmTable Size1,500mm X 500 mmDetectorFlat Panel Detector (High sensitivity)Dimension3,620(W) x 1,065(D) x 1,590(H)mm / 850kg
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60 GHz Systems and Modules
The Pasternack / Vubiq 60 GHz development system provides rapid evaluation of Pasternack’s 60 GHz waveguide modules and customer prototyping for system development. This 60 GHz developer kit is created from a partnership between Pasternack and Vubiq (pronounced “View-bik”), an industry expert in designing 60 GHz RF systems. Our 60 GHz wireless development system makes it easy to design new products and applications in the emerging unlicensed millimeter wave ISM band.
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Static Frequency Converter Systems
Our software and connectivity devices incorporate all the features you need to proactively manage your systems, from basic monitoring and shutdown to predictive analysis and power management. Aplab Integration Services offer complete solutions tailored for the specific requirements of Defense Services, Telecom and Commercial markets.
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PC Based Test Setup for Electric Iron Testing
SCR ELEKTRONIKS make PC Based Test Setup for Electric Iron Testing is useful to carry out various tests mentioned in IS 366:1991 clauses 10,11,12,13 & 14 on the Iron under test.
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AC & DC Aging Test Equipment for Arrester Valve Plate
Shanghai Guantu Technology Co., Ltd.
The arrester is usually connected between the live wire and the ground, and is connected in parallel with the protected equipment. When the overvoltage value reaches the specified operating voltage, the arrester will act immediately, flow the charge, limit the overvoltage amplitude, and protect the insulation of the equipment; when the voltage value is normal, the arrester will quickly return to its original state to ensure the normal power supply of the system.
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Electric Vehicle Charging Station EVSE Test Adapter
FEV100
Test the safety and performance of a type 1, level 1 or level 2 electric vehicle ac charging stations (EVSEs) with the Fluke FEV100. This test adapter simulates the presence of an electrical vehicle, allowing you to conduct tests in combination with appropriate test instruments such as a digital multimeter or oscilloscope.
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Aerospace System Development
For more than ten years, TechSAT provides to its customers research and development services for safety critical systems, primarily in electron-mechanical and avionics domains. At System Level we offer ARP4754A and ARP4761 compliant development including System Specification, Safety Assessment, System Architecture Design, Model based Validation, System Integration and Verification as well as certification support for Part 23 and Part 25 programs.At Equipment Level TechSAT offers customer specifi...show more -
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Seismic Transducers Calibration System
Calibration of the seismic sensors should be conducted in the low-frequency domain, which means, that the relative method used for calibration of the vibration transducers is not applicable since it does not guarantee the required accuracy level. The problem is that the reference accelerometers have uneven AFR characteristic in the low-frequency domain. Thus, calibration of seismic transducers requires implementation of a different approach.
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Cold Atomic Beam System
Detailed description of item: Complete cold atomic beam sources for alkaline-earth precision experiments and atomic devices. Small chambers with patented permanent-magnet Zeeman slowers and in-vacuum 2D MOT optics allow high flux with low outgassing and no thermal beam flux at the cold atom port, which provides a CF-133 connection to customer vacuum chamber. Advanced thermal design of the effusion oven allows long-lifetime operation at minimal heating power, with no water cooling. An integrated ...show more -
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In-Circuit Test Fixtures
In-circuit testing provides electronic manufacturers a reliable, high fault coverage verification method for the assembly process. Circuit Check ICT fixtures are robust, reliable and designed for easy customization to cover a large range of PCB sizes without impacting turnaround time. We stock a large variety of fixture sizes and actuation methods to meet your test demands. If a stocked sized ICT fixture is not adequate our engineering staff will design a custom solution.
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Ka-Band Antenna Systems
The KaStream 5000® MK II is specifically designed to provide maximum network flexibility and allow end-users to define the modem to meet their operational needs.
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Programmable RF Multi-Port Test
A programmable multi-port switch between your RF device under test and a Vector Network Analyzer significantly speeds up testing.
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Rack Mountable Video Test Generator
804A
The Teledyne LeCroy rack mountable quantumdata 804A Video Test Generator is optimized for testing modern HDMI HDTVs. The 804A Video Generator support testing Ultra HDTVs in manufacturing at 4K resolutions at pixel rates up to 300 MHz. This enables testing ultra HD TVs with 4K resolutions at 24/30Hz with 4:4:4 pixel sampling and encoding as well as 4K resolutions at 50/60Hz using HDMI 2.0 using HDMI 2.0 4:2:0 pixel sampling and encoding. The 804A also supports testing with HDMI 2.0 21:9 format resolutions at or below 300 MHz.
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Digital Relay Test Kit
PW636i-F
PW636i-F (6×32A, 4×300V, 8 fiber optic ports) is the new generation of PW series relay test set which can be used both as an conventional relay test kit and IEC61850 testing tools.
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Indicators - Test
Measures the deflection of the arm, the probe does not retract but swings in an arc around its hinge point.
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Video Test Generator
881E/882E-DP
The Teledyne LeCroy quantumdata 881E/882E test instruments with the DisplayPort 1.1 transmitter option is packed with features for video and audio testing of DisplayPort monitors and displays at pixel rates up to 268 MHz The 881E-DP version is a lower-cost version with the full DP transmitter functions necessary for testing modern displays on manufacturing production lines. The 882E-DP version includes all the features of the 881E-DP instrument but offers several feature upgrades that are not available for the 881E-DP version.
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Fiber-Based TCSPC System
*Hybrid Fiber System With Implantable Fiber Tip*Tip Removable from Fiber System*Seperate Excitation and Detection Fibers*Extremly Low Background Fluorescence*One or Two bh ps Diode Laser (BDS-SM or BDL-SMN Series)*High-Efficiency HPM-100-40 or -50 Hybrid Detector*Optional: Multi-Wavelength Detector
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RF Test Enclosure Ideal For Repeatable Testing, ≥90 DB Isolation, 300 MHz - 18 GHz
dbCHECK
The dbCHECK is an ideal solution for repeatable wireless device testing. Boasting a dual RF gasket design, high quality broadband RF absorber, and filtered I/O panels, the dbCHECK shielded box can achieve more than 90 dB* isolation from 300 MHz to 18 GHz. This level of isolation delivers maximum performance by attenuating all unwanted signals.
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RF & Wireless Test Solutions
Adivic/Chroma Group has been in the development of RF & WIreless test solutions for more than a decade. Take RF Recorder as an example, it has been adapted by all major Japanese & Korean automotive brand names such as Toyota, Mitsubishi, Honda, Hyundai, Daewoo...etc., most of the global IC design houses with DTV chips such as Broadcom, Marvell, MTK...etc., and also defense entities around the world.
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MECHANICAL TEST FIXTURE KITS
TX-MT-SERIES
Test-X MT Series mechanical kits are an affordable solution to printed circuit board testing. With multiple configurations and available options, this product is sure to meet your testing needs. The MT Series features a hinged 3/8" FR4 probe plate, tooling holes for accurate drilling, and side handles for easy transportation.
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Silicon Test & Yield Analysis Solutions
Tessent®
The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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ARINC 429 USB & LAN Test & Simulation Module
UXI-429
Avionics Interface Technologies
8 Channel (4Tx/4Rx) & 16 Channel (8 Tx/8 Rx) models available - Programmable Tx channel output amplitude - Programmable high/low speed operation - Concurrent operation of all Tx/Rx channels at high speed rates - Full error injection & detection - Rate-oriented label transmission - Label selective trigger for capture/filtering - Real-time recording & post analysis of multiple channels - Physical Bus Replay - Onboard IRIG-B time code encoder/decoder for Synchronization - Time Synchronization to IEEE 1588 via Ethernet LAN port - 10 Discrete I/O Interfaces (5 Outputs / 5 Inputs)
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Manufacturing Test Station
Scan Executive
The Scan ExecutiveTM Manufacturing Test Station is used to apply the same IEEE 1149.1 tests that were developed and used in the lab in a high-volume manufacturing environment without requiring additional development.
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Mobile Measuring System
For the purpose of oscillations period determination, there is used an indirect measuring method, which registers oscillation processes in three mutually transverse axes. As a result of measurements, one can obtain oscillations period values and corresponding decrement values for each of the axes.
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Telemetry Voice Announcing System
HTS-Voice
Designed to fit on the handle of all Hitec radios, this system audibly provides telemetry data via speakers or earphones.
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Physical Vapor Deposition Systems
Physical Vapor Deposition Systems offer maximum flexibility for a wide range of thin film deposition applications with advanced process capabilities, unsurpassed uniformity and multiple deposition modes.
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RISC-based DIN-rail Fanless Embedded System With I.MX 6UL Processor, COM, CANbus, 2 LANs And DIO (2-in/1-out)
IFB112
The IFB112.supports the low power consumption NXP (Freescale) i.MX6UL ARM® Cortex™-A7 528MHz SoC. The design concept of IFB112 is aiming to meet the demands of mission-critical applications. The gateway controller with IP30-rated aluminum and steel enclosure supports an extended operating temperature ranging from -40°C to 70°C, a wide voltage range of 9V - 48V DC power input with terminal block, and has been designed to withstand vibration up to 5G. For system integrators with wireless communica...show more -
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SAE AS5643 Mil-FireWire PXI Express Test & Simulation Instrument
HSSUB-6120
Avionics Interface Technologies
Highest density capability available in an AS5643 3U PXI Express, single slot instrument - Four (4) FireWire nodes, each with three (3) ports - Apps provide high-level (AS5643) and low-level (1394) access, while accommodating end-user customization - S100, S200, S400, S800 transfer rates - Support all Nodes operating concurrently at 800 Mbps - Independent transformer coupling for each port - Eight (8) standard PXI backplane triggers - Industry standard Texas Instruments IEEE 1394b Chipset - ANSI C (typical), C++/C#/LabVIEW
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Test Services
SHPB
Advance Instrument (AI) having solid knowledges and experiences in this field of materials measuring and testing, has developed a comprehensive suite of services providing test, modelling and validating high strain rate behavior of polymeric materials. AI can test tensile and compressive behavior of a wide variety of polymeric materials over strain rates ranging from 10(-3)/s to 10(3)/s combining conventional test techniques with advanced, high strain rate techniques using Split Hopkinson Pressure Bar (SHPB) and instrumented impact testing.
