Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Axle Damping Test Bench
C_MSD C 2.5 W250 | VP 215049
Maschinenbau Haldenwang GmbH & Co. KG.
The axle damping test bench C_MSD is characterised by a fast and precise mechanical testing of the axle damping. Through the frequency-controlled plate activation via electric motors, the maximum vibration amplitude is calculated and then the axle damping is evaluated according to the Lehr damping principle. The fully automatic test sequence, including the calculation of axle and vehicle weight, saves time and allows a reliable assessment of the axle damping.
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Advanced Power System - Dynamic DC Power Supply, 20 V, 50 A, 1000 W
N7951A
The N7900 Series dynamic DC power supplies are designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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Test Call Generator
Each call result is reported immediately and logged in the BluGem system database. BluGem calls are timed accurately utilising the networks layer 3 time-stamp, in accordance with industry standards. GPS/NTP timing alignment is also utilised to ensure call timing accuracy of the independent BluGem Call Data Records.
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Instrumentation System
Reach Technologies has leveraged the success of its automotive instrumentation, and applied it to other industries. The availability of established CAN products, coupled with its robustness, makes CAN a cost effective instrumentation solution. The software back-end of our instrumentation system is comprised of a server to interface to the data loggers, a database server to manage the data, and a web server for control and data visualization.
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Compact and Flexible Measurement System
Loggito
The Loggito series is a new compact and flexible measurement system for data acquisition Industry IoT. It enables inexpensive connectivity of decentralised measuring points for both low channel data logging and complex acquisition systems.
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Standard Lifetime Measurement System
Filter-Based Systems
*Excitation by bh ps Diode Lasers (BDS-SM or BDL-SMN Series)*Optional: fs Fiber Laser*Wavelength Selection by Filters*Detection by bh HPM-100 Hybrid Detectors*Excellent Dynamic Range*Ultra-High Time Resolution*IRF Width Down to 40 ps FWHM with HPM-100-06/07*Low Cost Detector Option: PMC-150 PMT Modules
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MXE EMI Test Receiver, 3 Hz to 44 GHz
N9038B
The Keysight N9038B is a standards-compliant MXE EMI test receiver and diagnostic signal analyzer built on an upgradeable platform. You choose the frequency coverage you need to fully test devices with outstanding accuracy and sensitivity across required ranges.
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In-Line Multiphase Sampling System
LP900X
The Mirmorax In-line Multiphase Sampling System provides the operator with a sample that, independent of flow regime and compositional mix, is a true volumetric representation of the flow.
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RF Test Enclosure Ideal For Repeatable Testing, ≥90 DB Isolation, 300 MHz - 18 GHz
dbCHECK
The dbCHECK is an ideal solution for repeatable wireless device testing. Boasting a dual RF gasket design, high quality broadband RF absorber, and filtered I/O panels, the dbCHECK shielded box can achieve more than 90 dB* isolation from 300 MHz to 18 GHz. This level of isolation delivers maximum performance by attenuating all unwanted signals.
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Diffractometers & Scattering Systems
Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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Vehicle Salt Spray Test Chamber
Dongguan City Simplewell Technology Co. Ltd.
Vehicle Salt Spray Test Chamber by Simplewell
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Hall Effect Measurement system
HMS-3300
Magnetic flux density : 0.55Tesla (+/-0.03T)Gap distance between both round magnets : 26mm / Round magnet diameter : 50mmMeasurable temp : RT ~ 300℃(model# HT55T3). Resolution : 0.1℃(Model# HT55T5 : RT ~ 500℃)Both HT55T3 and HT55T5 are only capable of using with HMS-3000 main body.(Not compatible with HMS-5000 )- You can flow purge gas into small chamber and measure hall effect at the same time. Gas control valve can be installed as an option.
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Audio Panel/Amplifier Test Fixture
TA-200
The Model TA-200 test panel was designed to allow Avionics shops the capability to test and troubleshoot both today's new generation audio panels as well as the standard audio panels of the past. The testing of these panels over the years has always proven to be a very time consuming job for most shops because of the limited capabilities of any past test panels.
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Large Area Detection System
FOERSTER MULTICAT
Foerster Instruments, Incorporated
The FOERSTER MULTICAT 4.850 is a robust non-magnetic trailer that can carry up to 8 FEREX probes for fast and precise detection over wide areas. It uses up to eight probes of the FEREX product family.
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Torque Test Kit
G201A11-16
To determine whether components of child-related products can be removed by a certain torque force. A torque-measuring device is used in conjunction with a torque clamp to record the applied force. Any projection, part or assembly of a child-related products that a child can grasp with at least the thumb & forefinger or the teeth shall be subject to the torque test.
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Abrasion Test Setup for Coating of Hair Straightener
SCR ELEKTRONIKS have developed "4 Stations Abrasion Test Setup for Coating of Hair Straightener" for Testing of Hair Straightener. It consists of Adjustable Constant Voltage source, Digital Timer, Digital Voltmeter, Digital Timer for carrying out Heating Test of Hair Straightener. It has got the capacity to check hair straightener that require test current 28 A at different Test Voltages.
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Source/Measure Unit for Functional Test, Multiple Ranges, 80 W, Double-wide
N6786A
Only Keysight`s N6780 Series SMUs let you visualize current drain from nA to A in one pass and one picture unlocking insights to deliver exceptional battery life.
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DC System Power Supply, 40V, 19A, 760W
N5746A
The single output, 760W N5746A provides universal AC input, GPIB, LAN, USB, LXI compliance, and analog/resistance control of output voltage and current.
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Flare Test Radiometer
PRS-2000
Infrared Systems Development Corp.
The PRS-2000 Dual Pyro-Radiometer Measures Energy in Two Spectral bands simultaneously. Its applications include Counter-Measure Flare Analysis, and Radiant Intensity Measurements. Custom Radiant Intensity Profile Software is Included. Testing in Watts/Steradian. The PRS-2000 is a rugged, field portable instrument that accurately measures IR emissions from a variety of targets.
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Semi- or Fully-Automatic Laser Repair System
LCD 6400
The Korima Model 6400-L offers an exceptional laser cutting system that exceeds the requirements for flat panel display, large photomask, and color filter repair. Fully automatic and remote controlled, the 6400-L comes with single, dual, or triple wavelength to achieve optimum results in the removal of aluminum, chromium, ITO, and polymide on panels before or after assembly.
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Development System
FE-SND2
* Emulates Atmel AT89C51SND2 Microcontrollers * 62K Code Memory * Real-Time Emulation * Frequency up to fmax * ISP and X2 Mode Support * Windows Debugger For C, C++ and Assembler * USB or RS-232 Linked to PC * C Compiler and Assembler
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X-ray Inspection System
RTX-113™
Glenbrook’s RTX-113 is designed for heavy production environments where X-ray is used to inspect PCBs and assembled PCBs containing advanced components such as BGA, micro BGA, QFN and other devices.
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Test Lead Set
34138A
The Keysight 34138A test lead set for digital multimeters contains fixed sheath banana plugs. The Keysight 34138A is compatible with the 34460A, 34461A, 34401A, 34405A, 34410A, 34411A, L4411A, and U2741A digital multimeters. 34138a is not compatible with 3458A instead use 34137A with 3458A.
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Single Function MIL-STD-1553 Test & Simulation PCIe Card
ASE1553M-x
Single Function MIL-STD-1553 Test and Simulation module for PCIe with 1, 2 or 4 dual redundant streams.
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Metrology Systems
VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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IEC61032 Test Probe Pin
CX-112
Shenzhen Chuangxin Instruments Co., Ltd.
1. Jointed test finger probe (Figure 2 / Test Probe B / IEC 61032)This is a precision probe made in accordance with all IEC standards. Examples are IEC 61032, 60950, 61010 and 60601; and it is also used for Canadian and USA standards. It features a palm simulator and a restricted joint movement, which simulates the characteristics of the human hand. The finger is made of stainless steel and the rest of the instrument is Delrin®. Handle is designed to accept either a banana jack or a force gauge.It is no longer necessary to have a separate probe for the medical safety standard. This one probe will meet all the different requirements that are in the IEC standards.
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Probe Card Test & Analysis
Automated probe card test and repair is used to monitor probe card health to ensure cards are ready and capable of testing semiconductor devices. In cases where the card is not meeting performance specification, repairs may be performed such as tip adjustment or card cleaning, thus returning the card quickly to a production state.